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EVOLUTION OF CIRCUIT FABRICS FOR NEW APPLICATIONS AND MODELING ISSUES

Scaling of integrated circuit technology continues to produce improved digital performance-complexity, low power, high performance. For many emerging areas, it is important to consider circuit fabrics and technology options that leverage these new applications.

This presentation will include several examples from ongoing research in sensor-based systems. In considering technology options-for both single-chip and multi-chip solutions-there are issues of practicality from the fabrication side as well as modeling challenges. Of special interest is the development of new bio-sensors where aspects of biological systems and mixed technologies required for integration are major challenges.

Emphasis will be given to a joint project of the Stanford University Department of Electrical Engineering and the Stanford Genome Technology Center (SGTC), where both advanced microelectro-mechanical systems (MEMS) fabrication and computer-aided modeling play key roles in realizing an integrated solution.

Speaker: Dr. Robert W. Dutton is a professor of electrical engineering and vice chair of the Department of Electrical Engineering at Stanford University. He received his BS, MS, and PhD degrees in electrical engineering from the University of California at Berkeley. His research has focused on computer simulation of integrated circuits including processing, devices, and circuit modeling. Industry has universally adopted simulation tools pioneered by his group. For more information, visit http://www-tcad.stanford.edu

Thursday, 11/11/10

Cost:

Free

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Lockheed Martin Colloquia

3251 Hanover St
Building 202 Auditorium
Palo Alto, CA 94304

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